Alicona installs fourth optical CMM system at the AMRC

CiMDec20News - alicona
CiMDec20News - alicona

Bruker Alicona has announced that the installation of a fourth µCMM focus variation optical metrology system at the University of Sheffield Advanced Manufacturing Research Centre (AMRC) indicates the centre’s commitment to optical metrology.

“We are very excited to have this state-of-the-art optical metrology system at the AMRC,” stated AMRC metrology manager, Richard James. “The capabilities of the system greatly enhance our metrology capability, the ability to measure vertical walls inside holes is going to be a game changer in our 'One Way Assembly' grand challenge research programme.

“We have had a long relationship with the Alicona products, which have helped the AMRC in many research projects into advanced manufacturing techniques which are now in production environments. We look forward to continuing this collaboration with Bruker Alicona in the future.”

The µCMM, is the first purely optical CMM. It is used to measure extremely tight tolerances in high accuracy. Users combine the advantages of tactile coordinate measuring technology and optical surface measuring technology to measure the dimension, position, shape and roughness of components with only one sensor.

The optical CMM offers high geometric accuracy of several optical 3D measurements in relation to each other, enabling the measurement of small surface details on large components and precisely determining the position of these individual measurements in relation to each other.

The spectrum of measurable surfaces includes all common industrial materials and composites such as plastics, PCD, CFRP, ceramics, chrome, silicon. Simple operation is implemented by single-button solutions, automation and ergonomic control elements such as a specially designed controller.

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Company

Alicona

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