National Instruments UK & Ireland, a leading authority in instrument control and test system design, has opened registration for a free one day conference to address current trends in test. The Automated Test Summit 2010 is an essential conference for engineers wanting to learn about the latest advances in automated and software-defined test.
Held at The Royal Berkshire Conference Centre, Madejski Stadium, Reading, on Thursday 10th June, the Summit will feature technical training, product and application demonstrations, industry case studies from end users, and hands-on sessions about the latest technologies for virtual and synthetic instrumentation.
Topics will include realtime and hardware-in-the-loop test, RF and wireless test, and the role of FPGAs in test, together with a focus on software-defined solutions using PXI and modular instrumentation. Attendees will gain valuable hands-on experience and hear from industry experts about how to reduce development time and ensure longevity.
Donald Blyth, (pictured) chief engineer (test) at Selex Galileo UK will present the keynote, giving his own industry perspective, with experience gained from a 25-year career history in test and instrumentation within the military and aerospace industry, whilst Eric Starkloff, NI vice president, product marketing for test, will speak about the Top Trends Changing The Face of Automated Test.
National Instruments suggest you attend the Automated Test Summit to see how companies reduce costs by investing in a platform that combines open PC technologies and modular instrumentation with industry-leading test system software.
www.ni.com/uk/testsummit
